Proceedings of the 2017 2nd International Conference on Automation, Mechanical Control and Computational Engineering (AMCCE 2017)

A High Precision Electronic Scale Based on STM32

Authors
JiaHui Chen
Corresponding Author
JiaHui Chen
Available Online March 2017.
DOI
10.2991/amcce-17.2017.13How to use a DOI?
Keywords
Electronic scales, Resistance strain gauge, STM32.
Abstract

A kind of high precision electronic scale with STM32F103 as the control core is designed. Mainly by the resistance strain gauge, operational amplifiers, ADC and other functional modules. Strain gages of the bridge circuit will be based on the pressure of different output voltage, through the amplifier to get a significant voltage change. Using 24-bit etc. digital-analog conversion chip, through the STM32 acquisition voltage. And the matrix keyboard design input unit price, peeled, calculate the total and overweight alarm and LCD screen display and automatic voltage calibration and other functions.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2017 2nd International Conference on Automation, Mechanical Control and Computational Engineering (AMCCE 2017)
Series
Advances in Engineering Research
Publication Date
March 2017
ISBN
10.2991/amcce-17.2017.13
ISSN
2352-5401
DOI
10.2991/amcce-17.2017.13How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - JiaHui Chen
PY  - 2017/03
DA  - 2017/03
TI  - A High Precision Electronic Scale Based on STM32
BT  - Proceedings of the 2017 2nd International Conference on Automation, Mechanical Control and Computational Engineering (AMCCE 2017)
PB  - Atlantis Press
SP  - 78
EP  - 82
SN  - 2352-5401
UR  - https://doi.org/10.2991/amcce-17.2017.13
DO  - 10.2991/amcce-17.2017.13
ID  - Chen2017/03
ER  -