Proceedings of the 2016 4th International Conference on Advanced Materials and Information Technology Processing (AMITP 2016)

Overpressure test and analysis of muzzle blast wave

Authors
Hong Liu, Tianshu Jin, Yongzhen Xing
Corresponding Author
Hong Liu
Available Online September 2016.
DOI
https://doi.org/10.2991/amitp-16.2016.5How to use a DOI?
Keywords
shock wave overpressure testing, wavelet analysis, overpressure peak.
Abstract
One of the main evaluation methods of damage effectiveness for weapon system is gathering muzzle shock wave signals through an overpressure test system of shock waves at first, then processing and analyzing acquired data. The evaluation performance depends on the appropriateness of signal processing. This paper proposes a method based on the multi-resolution characteristics of wavelet analysis to denoise the muzzle shock wave signal aimed at the characteristics of wide frequency band, sudden change and short duration of the shock wave signal, which not only filters the impurity signal effectively, but also reduces time delay. Then, according to the different locations of the sensors, overpressure peaks of every de-noising signal are obtained. The shock wave field is modeled by the interpolation methods with those overpressure peaks data. Finally, errors analysis of shock wave field model has been accomplished.
Open Access
This is an open access article distributed under the CC BY-NC license.

Download article (PDF)

Proceedings
2016 4th International Conference on Advanced Materials and Information Technology Processing (AMITP 2016)
Part of series
Advances in Computer Science Research
Publication Date
September 2016
ISBN
978-94-6252-245-9
ISSN
2352-538X
DOI
https://doi.org/10.2991/amitp-16.2016.5How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Hong Liu
AU  - Tianshu Jin
AU  - Yongzhen Xing
PY  - 2016/09
DA  - 2016/09
TI  - Overpressure test and analysis of muzzle blast wave
BT  - 2016 4th International Conference on Advanced Materials and Information Technology Processing (AMITP 2016)
PB  - Atlantis Press
SN  - 2352-538X
UR  - https://doi.org/10.2991/amitp-16.2016.5
DO  - https://doi.org/10.2991/amitp-16.2016.5
ID  - Liu2016/09
ER  -