Proceedings of the 2015 AASRI International Conference on Circuits and Systems

Roofwater Quality Simulation in Jinan Urban Area of China

Authors
Deng Haiyan, Wang Weiping, Xu Qiaoyi
Corresponding Author
Deng Haiyan
Available Online August 2015.
DOI
10.2991/cas-15.2015.25How to use a DOI?
Keywords
roofwater; turbidity; accumulation-washout model; initial removal.
Abstract

There are no any feasible theoretical methods for determining the initial removal of the roofwater now, which restrains the development of the roofwater utilization to some extent. The main sources of various pollutants in the roofwater and the variation of their concentrations are analyzed with the relevant sampling and testing. Based on the data of turbidity measured from five rainfall processes occurred in Jinan of University, the parameters of the accumulation-washout model for turbidity are estimated, and then the application scope of the model is determined with the relevant verification. The relationship between the turbidity removal rate and the pollutant washout index as well as the roof runoff coefficient are derived, which provides a practical calculation method for determining the initial removal of the roofwater.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 AASRI International Conference on Circuits and Systems
Series
Advances in Computer Science Research
Publication Date
August 2015
ISBN
10.2991/cas-15.2015.25
ISSN
2352-538X
DOI
10.2991/cas-15.2015.25How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Deng Haiyan
AU  - Wang Weiping
AU  - Xu Qiaoyi
PY  - 2015/08
DA  - 2015/08
TI  - Roofwater Quality Simulation in Jinan Urban Area of China
BT  - Proceedings of the 2015 AASRI International Conference on Circuits and Systems
PB  - Atlantis Press
SP  - 102
EP  - 104
SN  - 2352-538X
UR  - https://doi.org/10.2991/cas-15.2015.25
DO  - 10.2991/cas-15.2015.25
ID  - Haiyan2015/08
ER  -