Proceedings of the 2016 International Conference on Computer Engineering and Information Systems

A Release Control Policy Based on the Primary Bottleneck Workstation Utility of Multiple Semiconductor Manufacture Lines

Authors
Nan Xiang, Li Li
Corresponding Author
Nan Xiang
Available Online November 2016.
DOI
https://doi.org/10.2991/ceis-16.2016.69How to use a DOI?
Keywords
primary bottleneck workstation; workstation utility; multiple semiconductor manufacture lines
Abstract
Release control plays an important role in the performance of semiconductor manufacturing lines. Considering their characteristics, a release control policy based on the primary bottleneck workstation utility of multiple semiconductor manufacture lines (abbreviated as Rel_M2) is proposed. Comparing to common release control strategy CONWIP (Constant Work in Process), Rel_M2 can make full use of the primary bottleneck equipment of each manufacture line, increase the throughput, and improve the on-time delivery rate. The simulation results demonstrate that the throughput, on-time delivery rate and on-time delivery rate of hot job are increased by 17.46%, 85.84% and 53.65%, respectively. Moreover, the mean cycle time is decreased by 32.90%.
Open Access
This is an open access article distributed under the CC BY-NC license.

Download article (PDF)

Proceedings
2016 International Conference on Computer Engineering and Information Systems
Part of series
Advances in Computer Science Research
Publication Date
November 2016
ISBN
978-94-6252-283-1
DOI
https://doi.org/10.2991/ceis-16.2016.69How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Nan Xiang
AU  - Li Li
PY  - 2016/11
DA  - 2016/11
TI  - A Release Control Policy Based on the Primary Bottleneck Workstation Utility of Multiple Semiconductor Manufacture Lines
BT  - 2016 International Conference on Computer Engineering and Information Systems
PB  - Atlantis Press
UR  - https://doi.org/10.2991/ceis-16.2016.69
DO  - https://doi.org/10.2991/ceis-16.2016.69
ID  - Xiang2016/11
ER  -