Method of Top-level Design for Automated Test Systems
- 10.2991/eame-18.2018.52How to use a DOI?
- automatic test system; top-level design; requirements analysis; architecture selection; test equipment configuration
When designing an automatic test system, it is necessary to make each electronic test device conform to different test requirements. The most important issue is the system top-level design. The article starts with the three steps of the top-level design: system requirements analysis, architecture selection and analysis, and test equipment configuration. It describes in detail how to develop the top-level system design efficiently and reasonably when developing automated test systems. The principles, available method techniques, and precautions have some guiding significance for the top-level design of automated test systems.
- © 2018, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Zhenjie Zeng AU - Xiaofei Zhu AU - Shiju Qi AU - Kai Wu AU - Xiaowei Shen PY - 2018/06 DA - 2018/06 TI - Method of Top-level Design for Automated Test Systems BT - Proceedings of the 2018 3rd International Conference on Electrical, Automation and Mechanical Engineering (EAME 2018) PB - Atlantis Press SP - 248 EP - 251 SN - 2352-5401 UR - https://doi.org/10.2991/eame-18.2018.52 DO - 10.2991/eame-18.2018.52 ID - Zeng2018/06 ER -