Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)

Study on Testability Evaluation of Complex Equipment Based on Fault Injection Test Data

Authors
Zhiyu Li, Kaoli Huang, Guangyao Lian
Corresponding Author
Zhiyu Li
Available Online September 2012.
DOI
10.2991/emeit.2012.477How to use a DOI?
Keywords
fault injection, complex equipment, testability evaluation, Bayes evaluation method, inheritance factor
Abstract

Classic statistic method can not make use of the history test information and produce the evaluation conclusion with low confidence level and high risk under the condition of small sample, a new testability evaluation method based on test data in development stages is proposed in this paper. The result shows that this method can produce the evaluation conclusion with high confidence level in the same test condition and it is more rational with this new method than with classical statistical method and the traditional Bayes method.

Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
Series
Advances in Intelligent Systems Research
Publication Date
September 2012
ISBN
10.2991/emeit.2012.477
ISSN
1951-6851
DOI
10.2991/emeit.2012.477How to use a DOI?
Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Zhiyu Li
AU  - Kaoli Huang
AU  - Guangyao Lian
PY  - 2012/09
DA  - 2012/09
TI  - Study on Testability Evaluation of Complex Equipment Based on Fault Injection Test Data
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 2155
EP  - 2158
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.477
DO  - 10.2991/emeit.2012.477
ID  - Li2012/09
ER  -