Crack Tip Fields for Anti-plane Interfacial Crack between Functionally Graded and Homogeneous Piezoelectric Materials

DOI

10.2991/ic3me-15.2015.336How to use a DOI?

Keywords

crack tip fields, piezoelectric materials, interfacial crack, weak-discontinuity.

Abstract

The problem of an anti-plane crack situated in the interface of functionally graded piezoelectric materials (FGPMs) and homogeneous piezoelectric materials (HPMs) is considered under the impermeable assumption of crack surfaces. The mechanical and electrical properties of the FGPMs are assumed to be power functions of y perpendicular to the crack. The higher order crack tip stress and electric displacement fields for FGPMs and HPMs are obtained by the eigen-expansion method. The stress intensity factor and electric displacement intensity factor are obtained explicitly.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Xiao Chong
AU  - Yao Dai
AU  - Guixiang Hao
AU  - Zhiqiang Zhang
PY  - 2015/08
DA  - 2015/08
TI  - Crack Tip Fields for Anti-plane Interfacial Crack between Functionally Graded and Homogeneous Piezoelectric Materials
BT  - Proceedings of the 3rd International Conference on Material, Mechanical and Manufacturing Engineering
PB  - Atlantis Press
SP  - 1744
EP  - 1747
SN  - 2352-5401
UR  - https://doi.org/10.2991/ic3me-15.2015.336
DO  - 10.2991/ic3me-15.2015.336
ID  - Chong2015/08
ER  -