Proceedings of the 3rd International Conference on Advances in Energy and Environmental Science 2015

Influence of electrical joint compound on the temperature rise of electrical equipment

Authors
Jie Chen, Zhicheng Zhou, Jianjun Liu, Wei Lian
Corresponding Author
Jie Chen
Available Online July 2015.
DOI
10.2991/icaees-15.2015.199How to use a DOI?
Keywords
electrical joint compound; contact resistance; temperature rise; electrical equipment
Abstract

Electrical joint compound is widely used in metal connections of high-voltage electrical equipment. Based on studying a defect of electrical equipment connection fittings, the influence of electrical joint compound on the temperature rise of electrical equipment was studied according laboratory experiment and field test. It was found that, when the contact resistance of two aluminun achieved to 441 , the temperature rise shows centered in partial heat generation. Therefore, it is recommended to strengthen the quality control on the electrical joint compound, reduce temperature rise defective of electrical equipment.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 3rd International Conference on Advances in Energy and Environmental Science 2015
Series
Advances in Engineering Research
Publication Date
July 2015
ISBN
10.2991/icaees-15.2015.199
ISSN
2352-5401
DOI
10.2991/icaees-15.2015.199How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Jie Chen
AU  - Zhicheng Zhou
AU  - Jianjun Liu
AU  - Wei Lian
PY  - 2015/07
DA  - 2015/07
TI  - Influence of electrical joint compound on the temperature rise of electrical equipment
BT  - Proceedings of the 3rd International Conference on Advances in Energy and Environmental Science 2015
PB  - Atlantis Press
SP  - 1083
EP  - 1086
SN  - 2352-5401
UR  - https://doi.org/10.2991/icaees-15.2015.199
DO  - 10.2991/icaees-15.2015.199
ID  - Chen2015/07
ER  -