Research on the Effective Detection Methods of Large Scale IC Fault Signals

DOI

10.2991/iccse-15.2015.62How to use a DOI?

Keywords

Large scale IC, Fault detection, Detection method

Abstract

With the continuous development of electronic technology and the unceasing improvement of manufacturing process, large scale integrated circuits (ICs in abbreviation and IC for its single form henceforth) has now become more and more complex. In modern high-tech industrial equipment, however, its core component is one or a few key large scale ICs. So fault detection for these circuits directly determines qualified rate of the product as well as affects the normal operation of the electronic equipment at the later stage. Therefore, the research on effective fault detection methods for large scale ICs has very important practical meaning.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Junhong Li
PY  - 2015/07
DA  - 2015/07
TI  - Research on the Effective Detection Methods of Large Scale IC Fault Signals
BT  - Proceedings of the 2015 International Conference on Computational Science and Engineering
PB  - Atlantis Press
SP  - 337
EP  - 341
SN  - 2352-538X
UR  - https://doi.org/10.2991/iccse-15.2015.62
DO  - 10.2991/iccse-15.2015.62
ID  - Li2015/07
ER  -