Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering

Research on the DFT for Mixed-Signal Circuits

Authors
Guo-gang Lioa, Jun Li, Chun-yan Chen
Corresponding Author
Guo-gang Lioa
Available Online March 2013.
DOI
https://doi.org/10.2991/iccsee.2013.160How to use a DOI?
Keywords
fault detection,DFT,JTAG, Mixed-Signal Circuits.
Abstract
Nowadays with the increases of the density of large scale integrated circuits, researches of Design for Test (DFT) become more and more important. JTAG (JTAG: Joint Test Action Group, also called Boundary Scan) has been widely used in test area, which improves the testability and reliability of mixed-signal circuits. This paper puts forward a scheme to design a test System based on boundary scan technology. The system is realized in an electronic control system, which is composed of mixed-signal circuits. With this method, several test experiments are carried out in the system, which include infrastructure integrity test, interconnect test, cluster test, AD/DA test and so on. The results of experiments show that the system based on JTAG can work normally, which is able to promote the testability of system efficaciously. In a word, the capability of DFT is viable and the system is a virtual tool in the process of DFT design and application.
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Proceedings
Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering
Part of series
Advances in Intelligent Systems Research
Publication Date
March 2013
ISBN
978-90-78677-61-1
ISSN
1951-6851
DOI
https://doi.org/10.2991/iccsee.2013.160How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Guo-gang Lioa
AU  - Jun Li
AU  - Chun-yan Chen
PY  - 2013/03
DA  - 2013/03
TI  - Research on the DFT for Mixed-Signal Circuits
BT  - Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering
PB  - Atlantis Press
SN  - 1951-6851
UR  - https://doi.org/10.2991/iccsee.2013.160
DO  - https://doi.org/10.2991/iccsee.2013.160
ID  - Lioa2013/03
ER  -