Research on Reconfigurable Instruments Based on FPGA
Shaohui Cui, Mingze Gou, Jin Luo
Available Online December 2016.
- https://doi.org/10.2991/iceeecs-16.2016.132How to use a DOI?
- FPGA, Nios II, reconfigurable instruments, PXI.
- It is incidental for current automatic test system (ATS) to lead short of circuits, damage of instruments or units under test (UUT) by reason of its large amount of switches. To solve the problem, the technique of reconfigurable instrument is introduced. Using the reconfigurable instruments as substitutes for variety of single function instruments, the ATS reduces the number of switches, cuts down the redundancy of instruments and interfaces, improves reliability. By employing AP configuration mode, a FPGA partial reconfiguration scheme based on FLASH + SD card is introduced in this paper. The FPGA reconfiguration technology is analyzed and corresponding configuration SOPC system is designed. The reconfigurable instrument functions are realized combining the reconfigurable FPGA and universal peripheral circuits.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Shaohui Cui AU - Mingze Gou AU - Jin Luo PY - 2016/12 DA - 2016/12 TI - Research on Reconfigurable Instruments Based on FPGA BT - 2016 4th International Conference on Electrical & Electronics Engineering and Computer Science (ICEEECS 2016) PB - Atlantis Press SN - 2352-538X UR - https://doi.org/10.2991/iceeecs-16.2016.132 DO - https://doi.org/10.2991/iceeecs-16.2016.132 ID - Cui2016/12 ER -