Proceedings of the 2017 International Conference on Manufacturing Engineering and Intelligent Materials (ICMEIM 2017)

Study on Reconstruction of Spectral Reflectance with HIS

Authors
Xiao-min Zhang, Song-hua He, Qiao Chen
Corresponding Author
Xiao-min Zhang
Available Online February 2017.
DOI
10.2991/icmeim-17.2017.116How to use a DOI?
Keywords
Hyperspectral Imaging System (HIS),Spectral Reflectance, Relative Colorimetric Assay, Dark Field Correction
Abstract

This paper take reconstruction of spectral reflectance use Hyper-spectral Imaging System (HIS) as the main research object. A new method based on the relative colorimetric assay and dark field correction for spectral reflectance reconstructing be proposed to meet the need of high fidelity color reproduction(Hi-Fi) after test the property and the shooting parameters comprehensively. The principle and application of the method above are introduced thoroughly in this paper and be used to reconstruct the spectral reflectance of hyper-spectral imaging system. The performance of method above and flat-field method demonstrated that the method this paper proposed is better whether colorimetric or spectrum similarity.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2017 International Conference on Manufacturing Engineering and Intelligent Materials (ICMEIM 2017)
Series
Advances in Engineering Research
Publication Date
February 2017
ISBN
10.2991/icmeim-17.2017.116
ISSN
2352-5401
DOI
10.2991/icmeim-17.2017.116How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xiao-min Zhang
AU  - Song-hua He
AU  - Qiao Chen
PY  - 2017/02
DA  - 2017/02
TI  - Study on Reconstruction of Spectral Reflectance with HIS
BT  - Proceedings of the 2017 International Conference on Manufacturing Engineering and Intelligent Materials (ICMEIM 2017)
PB  - Atlantis Press
SP  - 683
EP  - 687
SN  - 2352-5401
UR  - https://doi.org/10.2991/icmeim-17.2017.116
DO  - 10.2991/icmeim-17.2017.116
ID  - Zhang2017/02
ER  -