Proceedings of the 2016 3rd International Conference on Materials Engineering, Manufacturing Technology and Control

Research of Logical Diagnoses of Device Tripping Based on SCADA Steady Information

Authors
Lei Shi, Yong Zhai, Chenglong Feng, Zhenyu Ruan
Corresponding Author
Lei Shi
Available Online April 2016.
DOI
10.2991/icmemtc-16.2016.150How to use a DOI?
Keywords
tripping alarm; accident handling; relay protection.
Abstract

Based on Tianjin 220kV power grid topology structure and protection setting configurations, the alarm steady information is mined deeply. Moreover, the big data of SCADA steady information is took full advantage to realize the accurate judges of all kinds of device tripping and the auxiliary information function of the reminding of relative protective action, which offers richer and more accurate alarm information and promotes the emergency handling ability for complex power grid.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 3rd International Conference on Materials Engineering, Manufacturing Technology and Control
Series
Advances in Engineering Research
Publication Date
April 2016
ISBN
10.2991/icmemtc-16.2016.150
ISSN
2352-5401
DOI
10.2991/icmemtc-16.2016.150How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Lei Shi
AU  - Yong Zhai
AU  - Chenglong Feng
AU  - Zhenyu Ruan
PY  - 2016/04
DA  - 2016/04
TI  - Research of Logical Diagnoses of Device Tripping Based on SCADA Steady Information
BT  - Proceedings of the 2016 3rd International Conference on Materials Engineering, Manufacturing Technology and Control
PB  - Atlantis Press
SP  - 756
EP  - 763
SN  - 2352-5401
UR  - https://doi.org/10.2991/icmemtc-16.2016.150
DO  - 10.2991/icmemtc-16.2016.150
ID  - Shi2016/04
ER  -