Proceedings of the 2016 International Conference on Engineering Management (Iconf-EM 2016)

The Improved Similarity Measures of Vague Sets under the Influence of the Waiver

Authors
Feng Weibing, Guo Luna, Wang Pan
Corresponding Author
Guo Luna
Available Online January 2017.
DOI
10.2991/iconfem-16.2016.44How to use a DOI?
Keywords
similarity measures; Vague sets; the impact of waiver; pattern recognition
Abstract

The similarity measure of vague sets is an important content for studying. A reasonable structure and the way to select a similarity measure will directly affect the classification of large data and the correct judgment of the data relationships. Based on the comparison and analysis of the existing similarity measures, and aiming at the shortcomings that it does not take into the abstained part to the impact of the similarity measures and cannot effectively distinguish the data in some existing similarity measures, this paper investigates the similarity measure of vague sets (values), proposes new formulas to calculate the similarity measure of vague sets (values) and proves the completeness of the definition in theory. The distinguishability and rationality of the improved similarity measures are also illustrated by experimental data and pattern recognition.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 International Conference on Engineering Management (Iconf-EM 2016)
Series
Advances in Economics, Business and Management Research
Publication Date
January 2017
ISBN
10.2991/iconfem-16.2016.44
ISSN
2352-5428
DOI
10.2991/iconfem-16.2016.44How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Feng Weibing
AU  - Guo Luna
AU  - Wang Pan
PY  - 2017/01
DA  - 2017/01
TI  - The Improved Similarity Measures of Vague Sets under the Influence of the Waiver
BT  - Proceedings of the 2016 International Conference on Engineering Management (Iconf-EM 2016)
PB  - Atlantis Press
SP  - 33
EP  - 39
SN  - 2352-5428
UR  - https://doi.org/10.2991/iconfem-16.2016.44
DO  - 10.2991/iconfem-16.2016.44
ID  - Weibing2017/01
ER  -