Proceedings of the AASRI International Conference on Industrial Electronics and Applications (2015)

A New BIST Scheme with Encoding Logic to Achieve Complete Fault Coverage

Authors
Zhang Ling, Mei Junjin, Wang Guan-zhong, Li Tonghan
Corresponding Author
Zhang Ling
Available Online September 2015.
DOI
https://doi.org/10.2991/iea-15.2015.11How to use a DOI?
Keywords
Built-in Self Test(BIST); test application time; fault coverage
Abstract

Built-in Self Test(BIST)has been proved as one of the effective design for testability techniques, where on-chip test architectures are designed to test the digital circuits themselves. To reduce test application time and improve fault coverage, A deterministic Built-in Self Test(BIST) technique that can get complete fault coverage without using any storage device is proposed in this paper. The test architecture contains a novel on chip encoding logic that generates all required test vectors in real time. Experimental results show that the proposed technique requires much less test application time to achieve complete fault coverage for all testable stuck-at faults with reasonable hardware cost.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the AASRI International Conference on Industrial Electronics and Applications (2015)
Series
Advances in Engineering Research
Publication Date
September 2015
ISBN
978-94-62520-65-3
ISSN
2352-5401
DOI
https://doi.org/10.2991/iea-15.2015.11How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Zhang Ling
AU  - Mei Junjin
AU  - Wang Guan-zhong
AU  - Li Tonghan
PY  - 2015/09
DA  - 2015/09
TI  - A New BIST Scheme with Encoding Logic to Achieve Complete Fault Coverage
BT  - Proceedings of the AASRI International Conference on Industrial Electronics and Applications (2015)
PB  - Atlantis Press
SP  - 40
EP  - 43
SN  - 2352-5401
UR  - https://doi.org/10.2991/iea-15.2015.11
DO  - https://doi.org/10.2991/iea-15.2015.11
ID  - Ling2015/09
ER  -