Proceedings of the AASRI International Conference on Industrial Electronics and Applications (2015)

Experiment Study on Yield Stress Using Curve Extension Method and Vane Method

Authors
Lyu Fuyan, Zhang Ningxiao, Zong Kai, Ao Chengdong, Di Haoxue, Wu Miao
Corresponding Author
Lyu Fuyan
Available Online September 2015.
DOI
https://doi.org/10.2991/iea-15.2015.54How to use a DOI?
Keywords
thick paste; yield stress; curve extension method; vane method; extend flow curve
Abstract

The yield stress is a key rheological parameter of thick paste and critical design parameter of the high pressure pipeline system. Take coal slurry as an example, whether using vane method or curve extension method, the yield stress both exponentially increase with concentration increasing, but the data of yield stress in two methods is different. For pipes with different diameters, the yield stress showed in pipeline transportation varies during the extension of rheology curves. By contrasting the results of curve extension method and vane method using pipelines with different diameters, it comes that with a certain concentration and a certain range of diameter, yield stress with vane is bigger than that with curve extension, due to the effect of wall slip in pipe flow test.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the AASRI International Conference on Industrial Electronics and Applications (2015)
Series
Advances in Engineering Research
Publication Date
September 2015
ISBN
978-94-62520-65-3
ISSN
2352-5401
DOI
https://doi.org/10.2991/iea-15.2015.54How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Lyu Fuyan
AU  - Zhang Ningxiao
AU  - Zong Kai
AU  - Ao Chengdong
AU  - Di Haoxue
AU  - Wu Miao
PY  - 2015/09
DA  - 2015/09
TI  - Experiment Study on Yield Stress Using Curve Extension Method and Vane Method
BT  - Proceedings of the AASRI International Conference on Industrial Electronics and Applications (2015)
PB  - Atlantis Press
SP  - 222
EP  - 225
SN  - 2352-5401
UR  - https://doi.org/10.2991/iea-15.2015.54
DO  - https://doi.org/10.2991/iea-15.2015.54
ID  - Fuyan2015/09
ER  -