Proceedings of the 2nd International Forum on Management, Education and Information Technology Application (IFMEITA 2017)

3D simulations of device performance for open-shell 3D-Trench electrode detector

Authors
Xiaojie Liu, Lipeng Tang, Chuan Liao, Zheng Li
Corresponding Author
Xiaojie Liu
Available Online February 2018.
DOI
10.2991/ifmeita-17.2018.100How to use a DOI?
Keywords
Open-shell closing three-dimensional electrode silicon detector; Geometric capacitance; Full depletion voltage
Abstract

Therefore silicon semiconductor detectors commonly used as radiation detector. In order to improve charge collection efficiency, an Open-Shell Electrode Detector, namely OSED (Chinese Patent #ZL201710732524.3) which is based on the Closed Shell-Electrode Detector (CSED), is proposed. The electrical characteristic curves of the cylindrical open shell 3D trench electrode detector, electric potential and electric field distribution, C-V curves under different open arc length are discussed and determined in this paper, with is benefit for the design of the detector.

Copyright
© 2018, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Forum on Management, Education and Information Technology Application (IFMEITA 2017)
Series
Advances in Social Science, Education and Humanities Research
Publication Date
February 2018
ISBN
10.2991/ifmeita-17.2018.100
ISSN
2352-5398
DOI
10.2991/ifmeita-17.2018.100How to use a DOI?
Copyright
© 2018, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xiaojie Liu
AU  - Lipeng Tang
AU  - Chuan Liao
AU  - Zheng Li
PY  - 2018/02
DA  - 2018/02
TI  - 3D simulations of device performance for open-shell 3D-Trench electrode detector
BT  - Proceedings of the 2nd International Forum on Management, Education and Information Technology Application (IFMEITA 2017)
PB  - Atlantis Press
SP  - 574
EP  - 577
SN  - 2352-5398
UR  - https://doi.org/10.2991/ifmeita-17.2018.100
DO  - 10.2991/ifmeita-17.2018.100
ID  - Liu2018/02
ER  -