Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering

The Analysis Research of Proximity Effect Correlation Algorithm for Accurate RF System

Authors
Ying Li
Corresponding Author
Ying Li
Available Online April 2015.
DOI
10.2991/isrme-15.2015.114How to use a DOI?
Keywords
RF system, correlation algorithm, proximity effect
Abstract

In this paper, we propose a novel research of proximity effect correlation algorithm for accurate RF system. In summary, we have demonstrated an efficient approach for broadband modeling of millimeter-wave CMOS FETs by using a set of pre-measured and pre-modeled cells with varied gate width. This approach allows a scalable and flexible modeling process, and simplifies the modeling procedures. The method has been verified with experimental results measured from 65-nm RF CMOS devices, where the modeled data match well with the measured data in a wide frequency range up to 40 GHz and across a wide range of gate width. The experimental shows the feasibility of our method.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
Series
Advances in Intelligent Systems Research
Publication Date
April 2015
ISBN
10.2991/isrme-15.2015.114
ISSN
1951-6851
DOI
10.2991/isrme-15.2015.114How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Ying Li
PY  - 2015/04
DA  - 2015/04
TI  - The Analysis Research of Proximity Effect Correlation Algorithm for Accurate RF System
BT  - Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
PB  - Atlantis Press
SP  - 542
EP  - 547
SN  - 1951-6851
UR  - https://doi.org/10.2991/isrme-15.2015.114
DO  - 10.2991/isrme-15.2015.114
ID  - Li2015/04
ER  -