Proceedings of the 2015 International Conference on Industrial Technology and Management Science

A Multi-scale Morphological Algorithm for AFM Micrograph Edge Detection

Authors
Xue Gang Fu, Hua Jiang
Corresponding Author
Xue Gang Fu
Available Online November 2015.
DOI
https://doi.org/10.2991/itms-15.2015.226How to use a DOI?
Keywords
Micrograph; Edge detection; Multi-scale; Morphology
Abstract
In this paper we present a new morphological edge detection method using a multi-scale approach. Edges of different fineness are detected using operator at different scale, and then they are regulated in order to eliminate the difference of gray attribution among multi-scale edges, and then combined to produce all the edges of interest in an image using the adaptive fusion method of minimums. The experiment results show that the fuzziness of image edge detection is reduced, and noise is removed efficiently, and distinct edges can be detected efficiently for micrograph.
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Proceedings
2015 International Conference on Industrial Technology and Management Science
Part of series
Advances in Computer Science Research
Publication Date
November 2015
ISBN
978-94-6252-123-0
ISSN
2352-538X
DOI
https://doi.org/10.2991/itms-15.2015.226How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Xue Gang Fu
AU  - Hua Jiang
PY  - 2015/11
DA  - 2015/11
TI  - A Multi-scale Morphological Algorithm for AFM Micrograph Edge Detection
BT  - 2015 International Conference on Industrial Technology and Management Science
PB  - Atlantis Press
SN  - 2352-538X
UR  - https://doi.org/10.2991/itms-15.2015.226
DO  - https://doi.org/10.2991/itms-15.2015.226
ID  - Fu2015/11
ER  -