The X-ray Radiation Response of CdZnTe Crystal Nuclear Detector
X.Y. Dai, H. Meng, Y.L. Zhang, J. Tao, R. Xu, J.J. Zhang, J. Huang, L. Wang, K. Tang, J.H. Min, L.J. Wang
Available Online November 2015.
- https://doi.org/10.2991/itms-15.2015.317How to use a DOI?
- CdZnTe; radiation response; radiation damage;
- The X-ray radiation response and radiation damage of CdZnTe (CZT) detector were studied in this paper. After rapid temperature annealing, the linearity of I-V curve was much better than before. Photo current of Au/CZT planar detector increased linearly with the X-ray intensity. An inflection point around 10-30 V was observed for different X-ray intensity. Below the inflection points, with the increase of applied voltage, photon current increased linearly, while the current still increased after the inflection point likely due to the illumination-related impact ionization effect. In addition, under exposure in strong X-ray intensity, the photo current remains unchanged before the inflection point while it changes significantly with after the inflection point.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - X.Y. Dai AU - H. Meng AU - Y.L. Zhang AU - J. Tao AU - R. Xu AU - J.J. Zhang AU - J. Huang AU - L. Wang AU - K. Tang AU - J.H. Min AU - L.J. Wang PY - 2015/11 DA - 2015/11 TI - The X-ray Radiation Response of CdZnTe Crystal Nuclear Detector PB - Atlantis Press SP - 1296 EP - 1299 SN - 2352-538X UR - https://doi.org/10.2991/itms-15.2015.317 DO - https://doi.org/10.2991/itms-15.2015.317 ID - Dai2015/11 ER -