The X-ray Radiation Response of CdZnTe Crystal Nuclear Detector
- 10.2991/itms-15.2015.317How to use a DOI?
- CdZnTe; radiation response; radiation damage;
The X-ray radiation response and radiation damage of CdZnTe (CZT) detector were studied in this paper. After rapid temperature annealing, the linearity of I-V curve was much better than before. Photo current of Au/CZT planar detector increased linearly with the X-ray intensity. An inflection point around 10-30 V was observed for different X-ray intensity. Below the inflection points, with the increase of applied voltage, photon current increased linearly, while the current still increased after the inflection point likely due to the illumination-related impact ionization effect. In addition, under exposure in strong X-ray intensity, the photo current remains unchanged before the inflection point while it changes significantly with after the inflection point.
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - X.Y. Dai AU - H. Meng AU - Y.L. Zhang AU - J. Tao AU - R. Xu AU - J.J. Zhang AU - J. Huang AU - L. Wang AU - K. Tang AU - J.H. Min AU - L.J. Wang PY - 2015/11 DA - 2015/11 TI - The X-ray Radiation Response of CdZnTe Crystal Nuclear Detector BT - Proceedings of the 2015 International Conference on Industrial Technology and Management Science PB - Atlantis Press SP - 1296 EP - 1299 SN - 2352-538X UR - https://doi.org/10.2991/itms-15.2015.317 DO - 10.2991/itms-15.2015.317 ID - Dai2015/11 ER -