Proceedings of the 2015 International Conference on Industrial Technology and Management Science

Mission Reliability Modeling Based on Logic Diagram

Authors
Jiaxin Jiang, Xiaohuan Zhu, Yaping Li
Corresponding Author
Jiaxin Jiang
Available Online November 2015.
DOI
https://doi.org/10.2991/itms-15.2015.403How to use a DOI?
Keywords
Mission Reliability; Modeling of Reliability; Fault Tree; Logic Diagram
Abstract
Based on the analysis of reliability block diagram and reliability model, the error of mission reliability bridge-model can be inferred. The error cause was worked out by the enumerations data set and the total probability formula, which proved that the inference is right, while the bridge-model of mission reliability was found correctly. A new modeling method, which based on mission profile logic diagram, was put forward with comparison of relation between logic gate and mission reliability model, to solve modeling difficulty for complex system, which need high level logical thinking while error is yet easily made. Application result shows that the method can express product mission profile logically, and get exact reliability model easily. According to comparison of relation between reliability logic diagram and fault tree, an indirect method was presented for complex system which was to get mission reliability through calculating top event probability of FT.
Open Access
This is an open access article distributed under the CC BY-NC license.

Download article (PDF)

Proceedings
2015 International Conference on Industrial Technology and Management Science
Part of series
Advances in Computer Science Research
Publication Date
November 2015
ISBN
978-94-6252-123-0
ISSN
2352-538X
DOI
https://doi.org/10.2991/itms-15.2015.403How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Jiaxin Jiang
AU  - Xiaohuan Zhu
AU  - Yaping Li
PY  - 2015/11
DA  - 2015/11
TI  - Mission Reliability Modeling Based on Logic Diagram
BT  - 2015 International Conference on Industrial Technology and Management Science
PB  - Atlantis Press
SN  - 2352-538X
UR  - https://doi.org/10.2991/itms-15.2015.403
DO  - https://doi.org/10.2991/itms-15.2015.403
ID  - Jiang2015/11
ER  -