Proceedings of the 2017 2nd Joint International Information Technology, Mechanical and Electronic Engineering Conference (JIMEC 2017)

<Previous Article In Volume
Next Article In Volume>

Design Of Automatic Test System For Transmitter Controller

Authors
Fangfang Liu, Hongshe Dang
Corresponding Author
Fangfang Liu
Available Online October 2017.
DOI
10.2991/jimec-17.2017.39How to use a DOI?
Keywords
controller; automatic test; LabVIEW; TestStand
Abstract

In the transmitter, the controller is used to realize the transmitter real-time monitoring and control.In order to guarantee the quality of the transmitter controller, for manual testing, high repetition rate, low efficiency and low accuracy problem, a set of automatic test system based on LabVIEW and TestStand has been designed and developed.Mainly introduced the the design process of the automatic test and test results for transmitter controller function, the system can test the function of the controller quickly and accurately according to the established sequence, it can effectively improve the test efficiency of the staff.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

<Previous Article In Volume
Next Article In Volume>
Volume Title
Proceedings of the 2017 2nd Joint International Information Technology, Mechanical and Electronic Engineering Conference (JIMEC 2017)
Series
Advances in Computer Science Research
Publication Date
October 2017
ISBN
10.2991/jimec-17.2017.39
ISSN
2352-538X
DOI
10.2991/jimec-17.2017.39How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

risenwbib
TY  - CONF
AU  - Fangfang Liu
AU  - Hongshe Dang
PY  - 2017/10
DA  - 2017/10
TI  - Design Of Automatic Test System For Transmitter Controller
BT  - Proceedings of the 2017 2nd Joint International Information Technology, Mechanical and Electronic Engineering Conference (JIMEC 2017)
PB  - Atlantis Press
SP  - 175
EP  - 178
SN  - 2352-538X
UR  - https://doi.org/10.2991/jimec-17.2017.39
DO  - 10.2991/jimec-17.2017.39
ID  - Liu2017/10
ER  -