Proceedings of the 2015 International Conference on Mechatronics, Electronic, Industrial and Control Engineering

A method of conflict checking for ontology integration based on distributed interpretation

Authors
Kun Liu, Xiaogao Yu, Weifeng Pan
Corresponding Author
Kun Liu
Available Online April 2015.
DOI
10.2991/meic-15.2015.192How to use a DOI?
Keywords
ontology integration; distributed interpretation; conflict; ontology closure; concept pair
Abstract

Ontology integration can be used to solve heterogeneity of different information. Different to the usual global interpretation, distributed interpretation based on DDL is taken to interpret its semantics. A phenomenon called conflict is found on this situation. We define what is conflict and make some difference with global interpretation. Then we design its checking algorithm. Depending on ontology closure, all relations of a concept pair are found and sent to global ontology to see whether one of them triggers conflict. Our method is suitable for the situation under which local ontology can not be opened to public for the safety , secret or other reason. Last a simulation is given to verify its feasibility.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Mechatronics, Electronic, Industrial and Control Engineering
Series
Advances in Engineering Research
Publication Date
April 2015
ISBN
10.2991/meic-15.2015.192
ISSN
2352-5401
DOI
10.2991/meic-15.2015.192How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Kun Liu
AU  - Xiaogao Yu
AU  - Weifeng Pan
PY  - 2015/04
DA  - 2015/04
TI  - A method of conflict checking for ontology integration based on distributed interpretation
BT  - Proceedings of the 2015 International Conference on Mechatronics, Electronic, Industrial and Control Engineering
PB  - Atlantis Press
SP  - 837
EP  - 840
SN  - 2352-5401
UR  - https://doi.org/10.2991/meic-15.2015.192
DO  - 10.2991/meic-15.2015.192
ID  - Liu2015/04
ER  -