A Competing Failure Model based on Compound SSI, Random Shocks and Catastrophic Failure

DOI

10.2991/mems.2012.42How to use a DOI?

Keywords

competing failure; probabilistic failure threshold; SSI; compound stress; random shock; dependent

Abstract

As products become increasingly complex, there are always more than one simple mechanisms that induce failure to the products, and failure modes are competing or dependent with each other rather than independent. Furthermore, the criterion to determine the failure state cannot be generalized to be a fixed value, thus probabilistic threshold is introduced. This paper proposed a probabilistic competing failure model based on catastrophic failure process and a dynamic compound SSI model, including cyclic operating stress and random shocks, where the cyclic stress can lead to the degradation of the strength. The independence of operating condition in each cycle is proved, thus the p.d.f. can be multiplied directly to achieve the joint probability. By assuming the linear relationship between the stress and the strength damage of each cycle, and Gaussian process to the stress and strength damage, the reliability of no strength degradation is developed through two parts with the random chocks which follows Poisson process. Usually, the catastrophic failure rate varies with the degradation of the strength. Therefore, a function of the strength is established to denote the dynamics of catastrophic failure rate. This model is demonstrated with a case of certain type of electronic product.

Copyright

© 2012, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Chen Hongxia
AU  - Chen Yunxia
PY  - 2012/12
DA  - 2012/12
TI  - A Competing Failure Model based on Compound SSI, Random Shocks and Catastrophic Failure
BT  - Proceedings of the 1st International Conference on Mechanical Engineering and Material Science (MEMS 2012)
PB  - Atlantis Press
SP  - 152
EP  - 156
SN  - 1951-6851
UR  - https://doi.org/10.2991/mems.2012.42
DO  - 10.2991/mems.2012.42
ID  - Hongxia2012/12
ER  -