Long-term-Storage Performance Degradation Causes of Fuse Electronic Components

DOI

10.2991/mmme-16.2016.149How to use a DOI?

Keywords

Electronic components; Performance degradation; Failure analysis

Abstract

The performance for fuse electronic components may have degradation after long-term-storage. In order to as-certain the components which its performance has degradation, two fuse electronic parts, which have been stored for 10 years, are chosen as samples for an accelerated test. It shows that the white noise from the resistance and the interfering noise between different resistances may lead the performance degradation. The zero drift due to the brokenness of bonding wire may magnify the noise voltage when under storage, and influence the reliability of the operational amplifier. The result indicates that the resistances and operational amplifiers should be concerned more when test fuse electronic device after a long storage.

Copyright

© 2016, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Yingwei Wu
AU  - Xinglin Qi
AU  - Tieshan Zhao
AU  - Bingfeng Yang
PY  - 2016/10
DA  - 2016/10
TI  - Long-term-Storage Performance Degradation Causes of Fuse Electronic Components
BT  - Proceedings of the 2016 4th International Conference on Mechanical Materials and Manufacturing Engineering
PB  - Atlantis Press
SP  - 629
EP  - 632
SN  - 2352-5401
UR  - https://doi.org/10.2991/mmme-16.2016.149
DO  - 10.2991/mmme-16.2016.149
ID  - Wu2016/10
ER  -