Long-term-Storage Performance Degradation Causes of Fuse Electronic Components
- 10.2991/mmme-16.2016.149How to use a DOI?
- Electronic components; Performance degradation; Failure analysis
The performance for fuse electronic components may have degradation after long-term-storage. In order to as-certain the components which its performance has degradation, two fuse electronic parts, which have been stored for 10 years, are chosen as samples for an accelerated test. It shows that the white noise from the resistance and the interfering noise between different resistances may lead the performance degradation. The zero drift due to the brokenness of bonding wire may magnify the noise voltage when under storage, and influence the reliability of the operational amplifier. The result indicates that the resistances and operational amplifiers should be concerned more when test fuse electronic device after a long storage.
- © 2016, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Yingwei Wu AU - Xinglin Qi AU - Tieshan Zhao AU - Bingfeng Yang PY - 2016/10 DA - 2016/10 TI - Long-term-Storage Performance Degradation Causes of Fuse Electronic Components BT - Proceedings of the 2016 4th International Conference on Mechanical Materials and Manufacturing Engineering PB - Atlantis Press SP - 629 EP - 632 SN - 2352-5401 UR - https://doi.org/10.2991/mmme-16.2016.149 DO - 10.2991/mmme-16.2016.149 ID - Wu2016/10 ER -