Proceedings of the 2018 3rd International Conference on Modelling, Simulation and Applied Mathematics (MSAM 2018)

Reliability Modeling of Complex Electronic System Based on Weibull Distribution

Authors
Linying Wei, Weilu Wu, Jun Xu
Corresponding Author
Linying Wei
Available Online July 2018.
DOI
10.2991/msam-18.2018.1How to use a DOI?
Keywords
triple Weibull distribution; bathtub curve; complex electronic system; failure law analysis
Abstract

The failure law is not clear in operation of complex electronic system. The failure data can not be effectively used. And it is difficult to assess the current state of the system. This paper proposed a fitting method of failure data based on triple Weibull distribution model for complex repairable long-life-cycle complex electronic system. Triple Weibull modeling method is used to analyze the accumulated operation time of complex electronic system. Maximum likelihood estimation is used to estimate the shape and scale parameters in Weibull distribution. And the specific iterative solution process is given. Using function continuity, the formula for the corresponding triple Weibull distribution is derived.And the key time inflection points and connection parameters are given. The failure data of electronic warfare system is used to analyze and verify the feasibility of the method.

Copyright
© 2018, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2018 3rd International Conference on Modelling, Simulation and Applied Mathematics (MSAM 2018)
Series
Advances in Intelligent Systems Research
Publication Date
July 2018
ISBN
10.2991/msam-18.2018.1
ISSN
1951-6851
DOI
10.2991/msam-18.2018.1How to use a DOI?
Copyright
© 2018, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Linying Wei
AU  - Weilu Wu
AU  - Jun Xu
PY  - 2018/07
DA  - 2018/07
TI  - Reliability Modeling of Complex Electronic System Based on Weibull Distribution
BT  - Proceedings of the 2018 3rd International Conference on Modelling, Simulation and Applied Mathematics (MSAM 2018)
PB  - Atlantis Press
SP  - 1
EP  - 4
SN  - 1951-6851
UR  - https://doi.org/10.2991/msam-18.2018.1
DO  - 10.2991/msam-18.2018.1
ID  - Wei2018/07
ER  -