Journal of Statistical Theory and Applications

Volume 12, Issue 3, September 2013, Pages 245 - 252

Parameters Estimation in a General Failure Rate Semi-Markov Reliability Model

Authors
M. Fathizadeh, K. Khorshidian
Corresponding Author
M. Fathizadeh
Received 7 August 2012, Accepted 7 July 2013, Available Online 1 September 2013.
DOI
10.2991/jsta.2013.12.3.3How to use a DOI?
Keywords
Bayesian estimation, Cold standby systems, Maximum likelihood, Semi-Markov process
Abstract

A semi-Markov process with four states, has been applied for modeling two dissimilar unit cold standby systems. At the moment that operating unit fails, the standby unit is switched to operate by using a switching device that is available with unknown probability alpha1. It is also assumed that the failure rate of unit i has the general form hi(t)= alpha2i + alpha2i+1 tbeta1-1, i=1,2, where alpha2...alpha5 are non-negative unknown parameters. In favor of semi-Markov structure of the system, maximum likelihood and the Bayes estimators of the unknown parameters alpha = (alpha1, alpha2...alpha5)are obtained while betai are non-negative known constants. Furthermore, the estimators are obtained for systems with similar units. Finally, to compare the results a simulation study is done.

Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Journal
Journal of Statistical Theory and Applications
Volume-Issue
12 - 3
Pages
245 - 252
Publication Date
2013/09/01
ISSN (Online)
2214-1766
ISSN (Print)
1538-7887
DOI
10.2991/jsta.2013.12.3.3How to use a DOI?
Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - JOUR
AU  - M. Fathizadeh
AU  - K. Khorshidian
PY  - 2013
DA  - 2013/09/01
TI  - Parameters Estimation in a General Failure Rate Semi-Markov Reliability Model
JO  - Journal of Statistical Theory and Applications
SP  - 245
EP  - 252
VL  - 12
IS  - 3
SN  - 2214-1766
UR  - https://doi.org/10.2991/jsta.2013.12.3.3
DO  - 10.2991/jsta.2013.12.3.3
ID  - Fathizadeh2013
ER  -