Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)

Study on SLT calibration method of 2-port waveguide DUT

Authors
Wenqiang Luo, Anyong Hu, Kai Liu, Xi Chen
Corresponding Author
Wenqiang Luo
Available Online November 2016.
DOI
https://doi.org/10.2991/aest-16.2016.37How to use a DOI?
Keywords
2-port waveguide DUT; SSLT calibration; VNA.
Abstract
SSLT (Short-offset-Short-Load-Through) is a classical calibration method of VNA (Vector Network Analyser) which needs multiple assembly of the standard parts and exists the impact of the phase in the millimetre waveband. Aimed that the S11 of the two-port waveguide DUT is less than -10dB, a simple SLT (Short-Load-Through) calibration method is presented in this paper according to the simplified error model. This calibration method only needs to carry on the calibration of short circuit plate and the matching load in the one-port of the VNA, and the through in the dual-port. The calibration process and the correction algorithm is simple. Finally, it is found that the amplitude relative error of the SLT calibration method is less than 2% and the phase calibration error is less than 2.5øthrough the statistics of several DUTs.
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Proceedings
2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
Part of series
Advances in Intelligent Systems Research
Publication Date
November 2016
ISBN
978-94-6252-257-2
DOI
https://doi.org/10.2991/aest-16.2016.37How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Wenqiang Luo
AU  - Anyong Hu
AU  - Kai Liu
AU  - Xi Chen
PY  - 2016/11
DA  - 2016/11
TI  - Study on SLT calibration method of 2-port waveguide DUT
BT  - 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
PB  - Atlantis Press
UR  - https://doi.org/10.2991/aest-16.2016.37
DO  - https://doi.org/10.2991/aest-16.2016.37
ID  - Luo2016/11
ER  -