Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)

Study on the isolated test technologies

Authors
Jiang Yang
Corresponding Author
Jiang Yang
Available Online November 2016.
DOI
10.2991/aest-16.2016.103How to use a DOI?
Keywords
Isolated test; photoelectric isolation; magnetoelectric isolation.
Abstract

This paper discusses the means of electrical isolation especially the characteristics of photoelectric isolation, magnetoelectric isolation and floating ground in common use. The two typical applications are presented based on applied requirement. One is analog testing module which consists of V/F conversion circuit and photoelectric isolation circuit. First analog signals are converted frequency signals and then frequency signals are transferred by photoelectric coupler. It is with low linearity error, high test precision and high isolated voltage. Another is digital signals test module based on isolated transformer. It uses the device which is quad-channel digital isolator with an intergraded isolated dc-to-dc converter. The device provides power supply to tested circuit. The module is small volume and high isolation voltage. Both applications are with practicability by validated with applied.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
Series
Advances in Intelligent Systems Research
Publication Date
November 2016
ISBN
10.2991/aest-16.2016.103
ISSN
1951-6851
DOI
10.2991/aest-16.2016.103How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Jiang Yang
PY  - 2016/11
DA  - 2016/11
TI  - Study on the isolated test technologies
BT  - Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
PB  - Atlantis Press
SP  - 765
EP  - 770
SN  - 1951-6851
UR  - https://doi.org/10.2991/aest-16.2016.103
DO  - 10.2991/aest-16.2016.103
ID  - Yang2016/11
ER  -