Proceedings of the 2017 International Conference on Applied Mathematics, Modeling and Simulation (AMMS 2017)

<Previous Article In Volume
Next Article In Volume>

A Method to Determine the Synthetical Acceleration Factor of Electronic Equipment Based on Failure Physics

Authors
Haoping Yan, Yuqing Hu, Yuexuan Ma, Tao Wang
Corresponding Author
Haoping Yan
Available Online November 2017.
DOI
10.2991/amms-17.2017.59How to use a DOI?
Keywords
component; reliability test simulation; accelerated test; acceleration factor
Abstract

Accelerated test is commonly used to obtain reliability data of products by exerting loads over usage conditions for highly reliable and long life products, and it's very significant to decide the acceleration factor (AF) in the test. For electronic equipment, the AF obtained by traditional method can only consider the internal failures caused by the components, without covering the interconnection failures caused by solder joints, pin failures, etc. Thus, a new method based on failure physics is presented in this study to determine the synthetical AF taking both internal failures and interconnection failures into consideration. The AF of the internal failures caused by the components is calculated based on the Arrhenius model, and the AF of the interconnection failures caused by solder joints is captured by reliability simulation test with a software called Calce PWA. Then, the synthetical AF of the electronic equipment can be determined by weighted fusion of both two AFs. Finally, the feasibility and validity of the proposed method can be verified by an application of an embedded electronic device.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

<Previous Article In Volume
Next Article In Volume>
Volume Title
Proceedings of the 2017 International Conference on Applied Mathematics, Modeling and Simulation (AMMS 2017)
Series
Advances in Intelligent Systems Research
Publication Date
November 2017
ISBN
10.2991/amms-17.2017.59
ISSN
1951-6851
DOI
10.2991/amms-17.2017.59How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

risenwbib
TY  - CONF
AU  - Haoping Yan
AU  - Yuqing Hu
AU  - Yuexuan Ma
AU  - Tao Wang
PY  - 2017/11
DA  - 2017/11
TI  - A Method to Determine the Synthetical Acceleration Factor of Electronic Equipment Based on Failure Physics
BT  - Proceedings of the 2017 International Conference on Applied Mathematics, Modeling and Simulation (AMMS 2017)
PB  - Atlantis Press
SP  - 263
EP  - 267
SN  - 1951-6851
UR  - https://doi.org/10.2991/amms-17.2017.59
DO  - 10.2991/amms-17.2017.59
ID  - Yan2017/11
ER  -