Proceedings of the 2015 International conference on Applied Science and Engineering Innovation

NAND Flash Bad Block Management Research Based On FPGA

Authors
Guohui Wu, Yongjie Hu, Jian Wu
Corresponding Author
Guohui Wu
Available Online May 2015.
DOI
10.2991/asei-15.2015.33How to use a DOI?
Keywords
NAND Flash, bad block management, mapping table
Abstract

For the requirement of the stability in large-capacity data storage, this paper proposes a management method of bad block based on setting up block address mapping table in the interior of FPGA. While operating the NAND Flash , we can take advantage of the mapping tables to shield inherent bad blocks and new produced blocks .The research proved that the method can avoid the operation of bad blocks efficiently and improve the reliability of data shortage greatly.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International conference on Applied Science and Engineering Innovation
Series
Advances in Engineering Research
Publication Date
May 2015
ISBN
10.2991/asei-15.2015.33
ISSN
2352-5401
DOI
10.2991/asei-15.2015.33How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Guohui Wu
AU  - Yongjie Hu
AU  - Jian Wu
PY  - 2015/05
DA  - 2015/05
TI  - NAND Flash Bad Block Management Research Based On FPGA
BT  - Proceedings of the 2015 International conference on Applied Science and Engineering Innovation
PB  - Atlantis Press
SP  - 149
EP  - 152
SN  - 2352-5401
UR  - https://doi.org/10.2991/asei-15.2015.33
DO  - 10.2991/asei-15.2015.33
ID  - Wu2015/05
ER  -