Proceedings of the 2nd International Conference on Civil, Materials and Environmental Sciences

A Calibration Method of Channel Error of Digital Measurement System Based on the One Element Linear Regression

Authors
Ji Xu
Corresponding Author
Ji Xu
Available Online April 2015.
DOI
10.2991/cmes-15.2015.35How to use a DOI?
Keywords
one element linear regression, channel errors, calibration method.
Abstract

Systematic error of digital measurement system (DSM) mainly exists in the analog measurement channels. The cause of systematic errors is circuit status and parameters of OPA, DAC and reference circuit which drift with changes in temperature and time deviate from the standard values. In this paper, firstly the causes of DMS errors are analyzed and errors calibration formula based on the one element linear regression is derived. Secondly equivalent formulas of zero drift, multiplying power changes and cascade in analog measurement channels are derived. Finally calibration of analog measurement channels is implemented in an engineering example.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Civil, Materials and Environmental Sciences
Series
Advances in Engineering Research
Publication Date
April 2015
ISBN
10.2991/cmes-15.2015.35
ISSN
2352-5401
DOI
10.2991/cmes-15.2015.35How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Ji Xu
PY  - 2015/04
DA  - 2015/04
TI  - A Calibration Method of Channel Error of Digital Measurement System Based on the One Element Linear Regression
BT  - Proceedings of the 2nd International Conference on Civil, Materials and Environmental Sciences
PB  - Atlantis Press
SP  - 121
EP  - 124
SN  - 2352-5401
UR  - https://doi.org/10.2991/cmes-15.2015.35
DO  - 10.2991/cmes-15.2015.35
ID  - Xu2015/04
ER  -