Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)

A contour extraction algorithm based on wavelet transform and dynamic contour compensation

Authors
Bao-Yan Mu, Shuai Chen, Yue Ma
Corresponding Author
Bao-Yan Mu
Available Online December 2016.
DOI
10.2991/eeeis-16.2017.14How to use a DOI?
Keywords
Edge Detection; Wavelet Transform; Contour Compensation.
Abstract

Contour extraction process is often disturbed by complex backgrounds or foregrounds in the machine vision system. A new contour extraction algorithm is proposed based on wavelet transform and dynamic contour compensation. The wavelet transform method is used to extract the edge of image, and the dynamic compensation is used to restore the contour which is affected by the complex dark areas such as bar code or black icon. The algorithm is applied in a sausage machine vision inspection system, and it is proved effective in eliminating the contour depression and retaining the actual defect features.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
Series
Advances in Engineering Research
Publication Date
December 2016
ISBN
10.2991/eeeis-16.2017.14
ISSN
2352-5401
DOI
10.2991/eeeis-16.2017.14How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Bao-Yan Mu
AU  - Shuai Chen
AU  - Yue Ma
PY  - 2016/12
DA  - 2016/12
TI  - A contour extraction algorithm based on wavelet transform and dynamic contour compensation
BT  - Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
PB  - Atlantis Press
SP  - 109
EP  - 115
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-16.2017.14
DO  - 10.2991/eeeis-16.2017.14
ID  - Mu2016/12
ER  -