Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)

Viable system model of transnational corporation organizational management based on human-electron analogy

Authors
Kun Shi
Corresponding Author
Kun Shi
Available Online December 2016.
DOI
10.2991/eeeis-16.2017.27How to use a DOI?
Keywords
Viable System Model; Transnational Corporation; Organization; Human-Electron Analogy.
Abstract

Transnational corporations are faced with the organizational management problem in the Internet age because of the complicated economic globalization. Viable system model is introduced to solve the problem as it provides the structure to survive in complex ecological environment and shall make the different organizations viable and living for transnational corporation. In the definition of viable, analogy between human and electron is elaborated and the model proves to be effective for organization innovation of transnational companies.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
Series
Advances in Engineering Research
Publication Date
December 2016
ISBN
10.2991/eeeis-16.2017.27
ISSN
2352-5401
DOI
10.2991/eeeis-16.2017.27How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Kun Shi
PY  - 2016/12
DA  - 2016/12
TI  - Viable system model of transnational corporation organizational management based on human-electron analogy
BT  - Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
PB  - Atlantis Press
SP  - 196
EP  - 201
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-16.2017.27
DO  - 10.2991/eeeis-16.2017.27
ID  - Shi2016/12
ER  -