Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)

A study on new customer satisfaction index model of smart grid

Authors
Ze-San Liu, Zhuo Yu, Ai-Qiang Dong
Corresponding Author
Ze-San Liu
Available Online December 2016.
DOI
10.2991/eeeis-16.2017.53How to use a DOI?
Keywords
ECSI, Smart Grid, customer satisfy index, SGCSI.
Abstract

The smart grid has been being built by State Grid Corporation, Inevitably, which must have a profound impact on customers. Based on the famous Fornell ECSI model, a new index model called SGCSI has been established according to the characteristics of the smart grid, which created a new index evaluation system, including seven evaluation indexes and the relation among them, such as corporate image, customer expectations, perceived quality and so on. Finally, the new Model was applied in an energy company, which result has been proved that it can more objectively reflect the actual situation of the smart grid, and have a better feature of practical operation.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
Series
Advances in Engineering Research
Publication Date
December 2016
ISBN
10.2991/eeeis-16.2017.53
ISSN
2352-5401
DOI
10.2991/eeeis-16.2017.53How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Ze-San Liu
AU  - Zhuo Yu
AU  - Ai-Qiang Dong
PY  - 2016/12
DA  - 2016/12
TI  - A study on new customer satisfaction index model of smart grid
BT  - Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
PB  - Atlantis Press
SP  - 417
EP  - 428
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-16.2017.53
DO  - 10.2991/eeeis-16.2017.53
ID  - Liu2016/12
ER  -