Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)

The application of Galois fields operation with chaos mapping in digital image encryption

Authors
Bing Liu, Qiang Chen
Corresponding Author
Bing Liu
Available Online December 2016.
DOI
10.2991/eeeis-16.2017.81How to use a DOI?
Keywords
digital image; image encryption; 3D chaos mapping; Galois field operation.
Abstract

A new digital image encryption method is proposed by introducing a chaos mapping combining matrix operations on Galois fields. The original image is mapped into two matrices by using chaos mapping, and then the original image matrix is processed sequentially with the two matrices over a Galois field to obtain the encrypted image. The experimental results show that the proposed method can obtain more uniform and fine scrambling effect than the traditional one, it has a stronger anti-jamming performance and faster encryption speed.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
Series
Advances in Engineering Research
Publication Date
December 2016
ISBN
10.2991/eeeis-16.2017.81
ISSN
2352-5401
DOI
10.2991/eeeis-16.2017.81How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Bing Liu
AU  - Qiang Chen
PY  - 2016/12
DA  - 2016/12
TI  - The application of Galois fields operation with chaos mapping in digital image encryption
BT  - Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
PB  - Atlantis Press
SP  - 669
EP  - 674
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-16.2017.81
DO  - 10.2991/eeeis-16.2017.81
ID  - Liu2016/12
ER  -