Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)

HKSD for deformation measurement of nonrigid biological tissues from MR images

Authors
Jia Chen, Ru-Han He, Xu-Bing Zhang, Jun Bai
Corresponding Author
Jia Chen
Available Online December 2016.
DOI
10.2991/eeeis-16.2017.104How to use a DOI?
Keywords
Feature point; Matching; Nonrigid; Image
Abstract

Due to the nonlinear deformation of nonrigid and nonuniform tissues, it is challenging to accurately measure the displacements of feature points distributed on the inner parts, boundaries, and separatrices of tissue layers. To address this challenge, we propose a feature point matching technique called HKSD to measure MR 2-D slice deformation of nonuniform and nonrigid biological tissues. Finally, we describe patches based on the Heat Kernel Signature (HKS). We apply Gaussian function as weigh to noise 2D image. The experimental results showed that the proposed HKSD method outperformed the single SURF and SIFT methods.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
Series
Advances in Engineering Research
Publication Date
December 2016
ISBN
10.2991/eeeis-16.2017.104
ISSN
2352-5401
DOI
10.2991/eeeis-16.2017.104How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Jia Chen
AU  - Ru-Han He
AU  - Xu-Bing Zhang
AU  - Jun Bai
PY  - 2016/12
DA  - 2016/12
TI  - HKSD for deformation measurement of nonrigid biological tissues from MR images
BT  - Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
PB  - Atlantis Press
SP  - 842
EP  - 849
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-16.2017.104
DO  - 10.2991/eeeis-16.2017.104
ID  - Chen2016/12
ER  -