Synchronous detection technology optics surface microstructure Research and characterization methods
Authors
Ning Pei, Dasen Wang, Fengming Nie, Shuhua Ji, Chengjun Guo, Guangping Zhang, Honglei Zhu, Yupeng Li
Corresponding Author
Ning Pei
Available Online November 2015.
- DOI
- 10.2991/iccet-15.2015.296How to use a DOI?
- Keywords
- Total integrated scattering; Detect; Optics
- Abstract
The total integrated scattering method for non-contact measurement technology, will not damage the surface of the sample, the instrument has a simple structure, low cost, high speed, high accuracy, less susceptible to environmental factors and other characteristics, has been widely used on the quality of the actual detection of the optical processing.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Ning Pei AU - Dasen Wang AU - Fengming Nie AU - Shuhua Ji AU - Chengjun Guo AU - Guangping Zhang AU - Honglei Zhu AU - Yupeng Li PY - 2015/11 DA - 2015/11 TI - Synchronous detection technology optics surface microstructure Research and characterization methods BT - Proceedings of the 5th International Conference on Civil Engineering and Transportation 2015 PB - Atlantis Press SP - 1587 EP - 1591 SN - 2352-5401 UR - https://doi.org/10.2991/iccet-15.2015.296 DO - 10.2991/iccet-15.2015.296 ID - Pei2015/11 ER -