Proceedings of the 7th International Conference on Education, Management, Information and Computer Science (ICEMC 2017)

Research on Application of Embedded System Based on Neural Network in Analog Circuit Fault Diagnosis

Authors
Wang Tao
Corresponding Author
Wang Tao
Available Online June 2016.
DOI
10.2991/icemc-17.2017.143How to use a DOI?
Keywords
BP neural network; Analog circuit; Fault diagnosis; Simulation analysis
Abstract

With the rapid development of modern electronic technology, the circuit is highly integrated and large-scale, which leads to the complexity of circuit fault diagnosis. Based on this, a method put forward in this paper is to use BP neural network to diagnose the fault of analog circuits. According to the characteristics of neural network embedded system, a hard fault diagnosis system is designed and simulated. The simulation results show that the fault tolerance of analog circuits can be well recognized when the fault tolerance is about 5%.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 7th International Conference on Education, Management, Information and Computer Science (ICEMC 2017)
Series
Advances in Computer Science Research
Publication Date
June 2016
ISBN
10.2991/icemc-17.2017.143
ISSN
2352-538X
DOI
10.2991/icemc-17.2017.143How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Wang Tao
PY  - 2016/06
DA  - 2016/06
TI  - Research on Application of Embedded System Based on Neural Network in Analog Circuit Fault Diagnosis
BT  - Proceedings of the 7th International Conference on Education, Management, Information and Computer Science (ICEMC 2017)
PB  - Atlantis Press
SP  - 709
EP  - 713
SN  - 2352-538X
UR  - https://doi.org/10.2991/icemc-17.2017.143
DO  - 10.2991/icemc-17.2017.143
ID  - Tao2016/06
ER  -