Proceedings of the 2nd International Conference on Electronics, Network and Computer Engineering (ICENCE 2016)

Optimization Study for Excitation System Simulation Model with Limit Function

Authors
Qian Cheng, Junfeng Zhang, Cong Fu
Corresponding Author
Qian Cheng
Available Online September 2016.
DOI
https://doi.org/10.2991/icence-16.2016.115How to use a DOI?
Keywords
Power System Simulation; Terminal Voltage; Optimal Modeling; RTDS
Abstract

In power system analysis software the simulation model of generator excitation system is not perfect, actual characteristics of the generator cannot be simulated accurately under some certain faults. Thus, an improved excitation simulation model with excitation limit is presented in this paper. The model structure and principle of excitation limit is studied and through using custom a module of DSP the improved excitation system is modeled. Then establish a single-machine infinite-bus system model in RTDS and PSD-BPA to verify the correctness and effectiveness of the simulation model. Finally through the comparison of dynamic simulation results of Guangdong grid, the method proposed in this paper effectively limits the terminal voltage.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Electronics, Network and Computer Engineering (ICENCE 2016)
Series
Advances in Computer Science Research
Publication Date
September 2016
ISBN
978-94-6252-229-9
ISSN
2352-538X
DOI
https://doi.org/10.2991/icence-16.2016.115How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Qian Cheng
AU  - Junfeng Zhang
AU  - Cong Fu
PY  - 2016/09
DA  - 2016/09
TI  - Optimization Study for Excitation System Simulation Model with Limit Function
BT  - Proceedings of the 2nd International Conference on Electronics, Network and Computer Engineering (ICENCE 2016)
PB  - Atlantis Press
SP  - 606
EP  - 613
SN  - 2352-538X
UR  - https://doi.org/10.2991/icence-16.2016.115
DO  - https://doi.org/10.2991/icence-16.2016.115
ID  - Cheng2016/09
ER  -