Voltage-Integration CMOS Image Sensor with Circuit-Sharing
Songsong Gao, Ying Wang, Weijian Si
Available Online March 2016.
- https://doi.org/10.2991/icmmct-16.2016.136How to use a DOI?
- analog-to-digital convertor, CMOS image sensor, circuit sharing, dynamic range.
- An improved voltage-integration CMOS image sensor is presented. Some circuits is shared between the voltage integration block and the analog-to-digital convertor (ADC) through an optimal operation timing, which makes use of the different input-signals selected by the switches. Dynamic range expansion is realized, whereas the power consuming and the circuit area in the improved structure do not significantly increase because there is only one integrator and one subtracter. The proposed image sensor structure, designed on 0.18um CMOS process under 3.3V supply, verifies the feasibility of the design approach.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Songsong Gao AU - Ying Wang AU - Weijian Si PY - 2016/03 DA - 2016/03 TI - Voltage-Integration CMOS Image Sensor with Circuit-Sharing BT - Proceedings of the 2016 4th International Conference on Machinery, Materials and Computing Technology PB - Atlantis Press SP - 698 EP - 706 SN - 2352-5401 UR - https://doi.org/10.2991/icmmct-16.2016.136 DO - https://doi.org/10.2991/icmmct-16.2016.136 ID - Gao2016/03 ER -