Voltage-Integration CMOS Image Sensor with Circuit-Sharing

DOI

10.2991/icmmct-16.2016.136How to use a DOI?

Keywords

analog-to-digital convertor, CMOS image sensor, circuit sharing, dynamic range.

Abstract

An improved voltage-integration CMOS image sensor is presented. Some circuits is shared between the voltage integration block and the analog-to-digital convertor (ADC) through an optimal operation timing, which makes use of the different input-signals selected by the switches. Dynamic range expansion is realized, whereas the power consuming and the circuit area in the improved structure do not significantly increase because there is only one integrator and one subtracter. The proposed image sensor structure, designed on 0.18um CMOS process under 3.3V supply, verifies the feasibility of the design approach.

Copyright

© 2016, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Songsong Gao
AU  - Ying Wang
AU  - Weijian Si
PY  - 2016/03
DA  - 2016/03
TI  - Voltage-Integration CMOS Image Sensor with Circuit-Sharing
BT  - Proceedings of the 2016 4th International Conference on Machinery, Materials and Computing Technology
PB  - Atlantis Press
SP  - 698
EP  - 706
SN  - 2352-5401
UR  - https://doi.org/10.2991/icmmct-16.2016.136
DO  - 10.2991/icmmct-16.2016.136
ID  - Gao2016/03
ER  -