Proceedings of the 2016 4th International Conference on Machinery, Materials and Computing Technology

Voltage-Integration CMOS Image Sensor with Circuit-Sharing

Authors
Songsong Gao, Ying Wang, Weijian Si
Corresponding Author
Songsong Gao
Available Online March 2016.
DOI
https://doi.org/10.2991/icmmct-16.2016.136How to use a DOI?
Keywords
analog-to-digital convertor, CMOS image sensor, circuit sharing, dynamic range.
Abstract
An improved voltage-integration CMOS image sensor is presented. Some circuits is shared between the voltage integration block and the analog-to-digital convertor (ADC) through an optimal operation timing, which makes use of the different input-signals selected by the switches. Dynamic range expansion is realized, whereas the power consuming and the circuit area in the improved structure do not significantly increase because there is only one integrator and one subtracter. The proposed image sensor structure, designed on 0.18um CMOS process under 3.3V supply, verifies the feasibility of the design approach.
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This is an open access article distributed under the CC BY-NC license.

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Volume Title
Proceedings of the 2016 4th International Conference on Machinery, Materials and Computing Technology
Series
Advances in Engineering Research
Publication Date
March 2016
ISBN
978-94-6252-165-0
ISSN
2352-5401
DOI
https://doi.org/10.2991/icmmct-16.2016.136How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Songsong Gao
AU  - Ying Wang
AU  - Weijian Si
PY  - 2016/03
DA  - 2016/03
TI  - Voltage-Integration CMOS Image Sensor with Circuit-Sharing
BT  - Proceedings of the 2016 4th International Conference on Machinery, Materials and Computing Technology
PB  - Atlantis Press
SP  - 698
EP  - 706
SN  - 2352-5401
UR  - https://doi.org/10.2991/icmmct-16.2016.136
DO  - https://doi.org/10.2991/icmmct-16.2016.136
ID  - Gao2016/03
ER  -