Proceedings of the 2015 6th International Conference on Manufacturing Science and Engineering

Control Chart Patterns Recognition based on DAG-SVM

Authors
Zhongbao Xiao, Shuhong Chen
Corresponding Author
Zhongbao Xiao
Available Online December 2015.
DOI
10.2991/icmse-15.2015.192How to use a DOI?
Keywords
DAG,SVM,PSO
Abstract

Statistical process control charts have been widely utilized in manufacturing processes for determining whether a process is run in its intended mode or in the presence of unnatural patterns, it’s a multi-class classifier problem. Effective approaches to recognize control chart patterns is essential for a manufacturing process to maintain high-quality products. This paper we use the Directed Acyclic Graph(DAG)tree learning architecture ,which combines many two-class classifiers together to solve the multi-class classifier problem. For each node we chose the support vector machine(SVM)using a particle swarm optimization(PSO) algorithm to optimize the parameter of the SVM kernel function. Here the PSO not only takes the kernel function parameters as variables but also the feature vector of the SVM to optimize .Simulation results show the propose algorithm achieves a high recognition accuracy and solve the unable recognition area.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 6th International Conference on Manufacturing Science and Engineering
Series
Advances in Engineering Research
Publication Date
December 2015
ISBN
10.2991/icmse-15.2015.192
ISSN
2352-5401
DOI
10.2991/icmse-15.2015.192How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Zhongbao Xiao
AU  - Shuhong Chen
PY  - 2015/12
DA  - 2015/12
TI  - Control Chart Patterns Recognition based on DAG-SVM
BT  - Proceedings of the 2015 6th International Conference on Manufacturing Science and Engineering
PB  - Atlantis Press
SP  - 1056
EP  - 1062
SN  - 2352-5401
UR  - https://doi.org/10.2991/icmse-15.2015.192
DO  - 10.2991/icmse-15.2015.192
ID  - Xiao2015/12
ER  -