Crystal structure and electrical resistivity of ZrAg0.46Al2.54

DOI

10.2991/itms-15.2015.364How to use a DOI?

Keywords

X-ray diffraction; Crystal structure; Electrical properties; Debye temperature;

Abstract

The new ZrAg0.46Al2.54 ternary compound has been prepared by arc-melting and studied by means of X-ray powder diffraction technique. The structural refinement of ZrAg0.46Al2.54 was performed by using Rietveld method. The ZrAg0.46Al2.54 compound crystallizes in the cubic Cu3Au-type structure with the space group (No.221) and the lattice parameter of a = 4.1074 (1). The structural refinement of ZrAg0.46Al2.54 leads to the reliability R factors to be Rp = 0.05, Rwp = 0.065, Rexp =0.039 and S = 1.65, respectively. Electrical resistivity of ZrAg0.46Al2.54 was also measured between 5 and 300K. Temperature variation of the electrical resistivity of ZrAg0.46Al2.54 suggests its metallic character. The Debye temperature of ZrAg0.46Al2.54 is calculated to be D = 361K.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Wei He
AU  - Tonghan Yang
AU  - Hongrui Liu
AU  - Haichang Zhong
AU  - Jingxian Wen
PY  - 2015/11
DA  - 2015/11
TI  - Crystal structure and electrical resistivity of ZrAg0.46Al2.54
BT  - Proceedings of the 2015 International Conference on Industrial Technology and Management Science
PB  - Atlantis Press
SP  - 1492
EP  - 1495
SN  - 2352-538X
UR  - https://doi.org/10.2991/itms-15.2015.364
DO  - 10.2991/itms-15.2015.364
ID  - He2015/11
ER  -