Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering

Microstructure Formation and Toughening Effect of TiAl Based Microlaminate Sheet Deposited by Electron Beam

Authors
Lu-ju He, Li Ma, Xian-yi Shao
Corresponding Author
Lu-ju He
Available Online December 2015.
DOI
10.2991/nceece-15.2016.160How to use a DOI?
Keywords
EBPVD; Microstructure;Toughening;TiAl intermetallic; Mechanical properties
Abstract

A free-standing TiAl based microlaminate sheet with thickness of 300 m was deposited with high-power electron beam physical vapour deposition system. Microstructure and phase analysis of as-deposited samples were studied by XRD, SEM and TEM. Toughening by structure was analyzed with tensile test. The results show as-deposited sample was constituted of 2-Ti3Al and -TiAl and -Ti. Alternation of rich aluminum zone and rich titanium zone are presented along cross section of TiAl depositing layer resulted from deviation of saturated vapor pressure between aluminum and titanium. After densification treatment, room-temperature tensile strength and elongation increased compared to that of as-deposited samples reached 657 MPa and 2.95%, respectively. Tensile strength under high temperature exhibits an abnormal increase, exceeding 450 MPa at 1023K. The presence of ductile Ti layers can lead to cracks stagger along inter-laminar interfaces or crack deflection and the micro-bridge connection caused by ductile Ti layers, due to the TiAl-Ti3Al/ -Ti micro-laminate displaying a fine characteristic of delayed fracture.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
Series
Advances in Engineering Research
Publication Date
December 2015
ISBN
10.2991/nceece-15.2016.160
ISSN
2352-5401
DOI
10.2991/nceece-15.2016.160How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Lu-ju He
AU  - Li Ma
AU  - Xian-yi Shao
PY  - 2015/12
DA  - 2015/12
TI  - Microstructure Formation and Toughening Effect of TiAl Based Microlaminate Sheet Deposited by Electron Beam
BT  - Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
PB  - Atlantis Press
SP  - 880
EP  - 885
SN  - 2352-5401
UR  - https://doi.org/10.2991/nceece-15.2016.160
DO  - 10.2991/nceece-15.2016.160
ID  - He2015/12
ER  -