Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)

Software fault debugging based on data flow analysis

Authors
Xi Guo, Pan Wang, Peng-Fei Wu
Corresponding Author
Xi Guo
Available Online December 2016.
DOI
10.2991/eeeis-16.2017.120How to use a DOI?
Keywords
Software debug; Data flow analysis; Software testing
Abstract

Data Flow Analysis is a difficult issue in the domain of fault localization, and many software faults are related to the information of data flow. The dependency between the variants and the define-use chain are discussed in this paper, and trace the impact to the variants in the process of operation. In this paper, a data flow model is proposed which can demonstrate the change of the variant value and the dependency between the variants and it can be used to debug the faults in the program. Experimental results demonstrate that this method has better results than the traditional methods.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
Series
Advances in Engineering Research
Publication Date
December 2016
ISBN
10.2991/eeeis-16.2017.120
ISSN
2352-5401
DOI
10.2991/eeeis-16.2017.120How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xi Guo
AU  - Pan Wang
AU  - Peng-Fei Wu
PY  - 2016/12
DA  - 2016/12
TI  - Software fault debugging based on data flow analysis
BT  - Proceedings of the 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2016)
PB  - Atlantis Press
SP  - 986
EP  - 991
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-16.2017.120
DO  - 10.2991/eeeis-16.2017.120
ID  - Guo2016/12
ER  -