Proceedings of the 2nd International Conference on Electronics, Network and Computer Engineering (ICENCE 2016)

Test Configuration for Incipient Fault Detection

Authors
Shuming Yang, Xiaoyu Wen, Xiaofei Zhang
Corresponding Author
Shuming Yang
Available Online September 2016.
DOI
10.2991/icence-16.2016.86How to use a DOI?
Keywords
Equipment Health Management; Design for Testability; Test Optimization Configuration; Generic Algorithm
Abstract

Information sensing and test are premise and foundation of (Equipment Health Management, EHM), a reasonable sensor configuration not only provide accurate and complete fault information, but also improve fault diagnostics, fault prognostics and health state evaluation capability. To address the problem that the traditional test selection and optimization are mainly for fault detection and isolation, then, testability indices for EHM are firstly formulated quantitatively, then, test optimization selection model which minimizes test cost is modeled, and the generic algorithm is introduced to solve the problem. At last, a simulation case and an application case are given to verify & validate the proposed model and method.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Electronics, Network and Computer Engineering (ICENCE 2016)
Series
Advances in Computer Science Research
Publication Date
September 2016
ISBN
10.2991/icence-16.2016.86
ISSN
2352-538X
DOI
10.2991/icence-16.2016.86How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Shuming Yang
AU  - Xiaoyu Wen
AU  - Xiaofei Zhang
PY  - 2016/09
DA  - 2016/09
TI  - Test Configuration for Incipient Fault Detection
BT  - Proceedings of the 2nd International Conference on Electronics, Network and Computer Engineering (ICENCE 2016)
PB  - Atlantis Press
SP  - 454
EP  - 458
SN  - 2352-538X
UR  - https://doi.org/10.2991/icence-16.2016.86
DO  - 10.2991/icence-16.2016.86
ID  - Yang2016/09
ER  -