Proceedings of the 2015 International Power, Electronics and Materials Engineering Conference

Active Distribution Network Bifurcation and Voltage Stability Research

Authors
Xianbin Dai
Corresponding Author
Xianbin Dai
Available Online May 2015.
DOI
10.2991/ipemec-15.2015.73How to use a DOI?
Keywords
bifurcation theory; active distribution network; voltage stability
Abstract

It analyzes the common bifurcation categories in active distribution network; based on the active distribution network's wind field system model, it changes the reactive power parameters of its load model and conducts studies on the influence brought by reactive power on voltage stability based on bifurcation theory; it calculates Hopf Bifurcation Point in the wind power system containing SVC; it judges Hopf Bifurcation based on parsing algorithm; it analyzes the influence brought by reactive power and VC on wind power system. The result indicates that the increase of reactive power in wind power system will create Hopf Bifurcation in the system and it will use SVC to conduct reactive compensation, by which it will delay Hopf Bifurcation and elevate the active distribution network's voltage stability.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Power, Electronics and Materials Engineering Conference
Series
Advances in Engineering Research
Publication Date
May 2015
ISBN
10.2991/ipemec-15.2015.73
ISSN
2352-5401
DOI
10.2991/ipemec-15.2015.73How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xianbin Dai
PY  - 2015/05
DA  - 2015/05
TI  - Active Distribution Network Bifurcation and Voltage Stability Research
BT  - Proceedings of the 2015 International Power, Electronics and Materials Engineering Conference
PB  - Atlantis Press
SP  - 376
EP  - 380
SN  - 2352-5401
UR  - https://doi.org/10.2991/ipemec-15.2015.73
DO  - 10.2991/ipemec-15.2015.73
ID  - Dai2015/05
ER  -