Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering

Analysis of Old and New Driver's Rear-end Collision Risk

Authors
Xiaowei Lian, Fuju Liu, Xudong Li
Corresponding Author
Xiaowei Lian
Available Online December 2015.
DOI
10.2991/nceece-15.2016.101How to use a DOI?
Keywords
risk; driving year; rear-end collision; dangerous working condition; analysis
Abstract

Rear-end accident is mainly due to the poor risk of driver’s feelings, and cannot be fully aware of the transport of dangerous. In order to study the cause of accidents and the difference between the novice group and experience group in risk perception. This study through the contrast test for inexperienced, moderately experienced and very experienced drivers, studies the driver’s risk differences. For each scene, the drivers' level of risk is compared, and the differences between drivers of different driving experience level are analyzed. Whether in dangerous working conditions or accidents, the driver has a different experience difference in quantity of dangerous events. Moreover, this shows that it is necessary to study naturalistic driving in China.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
Series
Advances in Engineering Research
Publication Date
December 2015
ISBN
10.2991/nceece-15.2016.101
ISSN
2352-5401
DOI
10.2991/nceece-15.2016.101How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xiaowei Lian
AU  - Fuju Liu
AU  - Xudong Li
PY  - 2015/12
DA  - 2015/12
TI  - Analysis of Old and New Driver's Rear-end Collision Risk
BT  - Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
PB  - Atlantis Press
SP  - 542
EP  - 546
SN  - 2352-5401
UR  - https://doi.org/10.2991/nceece-15.2016.101
DO  - 10.2991/nceece-15.2016.101
ID  - Lian2015/12
ER  -