Use of Automation in Sensor Readout ASIC Chip Characterization to Improve Test Yield, Coverage and Man-Hour Reduction
Noor Shelida Salleh, Siti Noor Harun, Tan Kong Yew
Noor Shelida Salleh
Available Online November 2015.
- https://doi.org/10.2991/tmcm-15.2015.6How to use a DOI?
- ion sensing electrode; ion sensing field effect transistor; moisture sensor
- An approach for efficient sensor readout ASIC chip characterization is presented in this paper. Use of automation results in better test yield and coverage, in addition to man-hour reduction. In order to perform this, the hardware setup has been integrated based on laboratory bench instrumentation. All of hardware is controlled by software written in VEE PRO graphical programming language.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Noor Shelida Salleh AU - Siti Noor Harun AU - Tan Kong Yew PY - 2015/11 DA - 2015/11 TI - Use of Automation in Sensor Readout ASIC Chip Characterization to Improve Test Yield, Coverage and Man-Hour Reduction BT - Proceedings of the 2015 International Conference on Test, Measurement and Computational Methods PB - Atlantis Press SP - 20 EP - 23 SN - 2352-538X UR - https://doi.org/10.2991/tmcm-15.2015.6 DO - https://doi.org/10.2991/tmcm-15.2015.6 ID - Salleh2015/11 ER -