Proceedings of the 2015 International Conference on Test, Measurement and Computational Methods

Use of Automation in Sensor Readout ASIC Chip Characterization to Improve Test Yield, Coverage and Man-Hour Reduction

Authors
Noor Shelida Salleh, Siti Noor Harun, Tan Kong Yew
Corresponding Author
Noor Shelida Salleh
Available Online November 2015.
DOI
https://doi.org/10.2991/tmcm-15.2015.6How to use a DOI?
Keywords
ion sensing electrode; ion sensing field effect transistor; moisture sensor
Abstract
An approach for efficient sensor readout ASIC chip characterization is presented in this paper. Use of automation results in better test yield and coverage, in addition to man-hour reduction. In order to perform this, the hardware setup has been integrated based on laboratory bench instrumentation. All of hardware is controlled by software written in VEE PRO graphical programming language.
Open Access
This is an open access article distributed under the CC BY-NC license.

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Proceedings
2015 International Conference on Test, Measurement and Computational Methods
Part of series
Advances in Computer Science Research
Publication Date
November 2015
ISBN
978-94-6252-132-2
ISSN
2352-538X
DOI
https://doi.org/10.2991/tmcm-15.2015.6How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Noor Shelida Salleh
AU  - Siti Noor Harun
AU  - Tan Kong Yew
PY  - 2015/11
DA  - 2015/11
TI  - Use of Automation in Sensor Readout ASIC Chip Characterization to Improve Test Yield, Coverage and Man-Hour Reduction
BT  - 2015 International Conference on Test, Measurement and Computational Methods
PB  - Atlantis Press
SP  - 20
EP  - 23
SN  - 2352-538X
UR  - https://doi.org/10.2991/tmcm-15.2015.6
DO  - https://doi.org/10.2991/tmcm-15.2015.6
ID  - Salleh2015/11
ER  -