Use of Automation in Sensor Readout ASIC Chip Characterization to Improve Test Yield, Coverage and Man-Hour Reduction

DOI

10.2991/tmcm-15.2015.6How to use a DOI?

Keywords

ion sensing electrode; ion sensing field effect transistor; moisture sensor

Abstract

An approach for efficient sensor readout ASIC chip characterization is presented in this paper. Use of automation results in better test yield and coverage, in addition to man-hour reduction. In order to perform this, the hardware setup has been integrated based on laboratory bench instrumentation. All of hardware is controlled by software written in VEE PRO graphical programming language.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Noor Shelida Salleh
AU  - Siti Noor Harun
AU  - Tan Kong Yew
PY  - 2015/11
DA  - 2015/11
TI  - Use of Automation in Sensor Readout ASIC Chip Characterization to Improve Test Yield, Coverage and Man-Hour Reduction
BT  - Proceedings of the 2015 International Conference on Test, Measurement and Computational Methods
PB  - Atlantis Press
SP  - 20
EP  - 23
SN  - 2352-538X
UR  - https://doi.org/10.2991/tmcm-15.2015.6
DO  - 10.2991/tmcm-15.2015.6
ID  - Salleh2015/11
ER  -