Proceedings of the 2015 International Conference on Test, Measurement and Computational Methods

Test and Analysis of High Voltage and High Frequency Capacitors Concerning Frequency Characteristics

Authors
Heisik Kim, Seoyeon Won, Daeseong Hwang, Kyeongjin Lee
Corresponding Author
Heisik Kim
Available Online November 2015.
DOI
https://doi.org/10.2991/tmcm-15.2015.7How to use a DOI?
Keywords
capacitor; test; frequency characteristics; high power; LC circuit; induction heater; film condenser; water cooled capacitor; rolling MPP
Abstract
The high frequency and high voltage capacitor was designed and tested and produced with precision technology. The film winding machine was installed and installed to produce new designed capacitors. By winding capacitor core, MPP (Metalized Film on Propylene Film) and PP (Propylene Film) or Aluminum film were feed together in multi-layers into the roll with very adjusted and controlled tension force. By testing to analysis of new designed various capacitors with different tension methods. The resonance frequency and allowable frequency range and durable high voltage of all new designed capacitor core roll were tested. The test result with prototype roll showed allowable frequency of 700 KHz and 450 Volt AC. They were approved enough proper performance by the detailed test procedure to be applied for high power induction heater LC circuit of industrial heating facilities.
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Proceedings
2015 International Conference on Test, Measurement and Computational Methods
Part of series
Advances in Computer Science Research
Publication Date
November 2015
ISBN
978-94-6252-132-2
ISSN
2352-538X
DOI
https://doi.org/10.2991/tmcm-15.2015.7How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Heisik Kim
AU  - Seoyeon Won
AU  - Daeseong Hwang
AU  - Kyeongjin Lee
PY  - 2015/11
DA  - 2015/11
TI  - Test and Analysis of High Voltage and High Frequency Capacitors Concerning Frequency Characteristics
BT  - 2015 International Conference on Test, Measurement and Computational Methods
PB  - Atlantis Press
SP  - 24
EP  - 25
SN  - 2352-538X
UR  - https://doi.org/10.2991/tmcm-15.2015.7
DO  - https://doi.org/10.2991/tmcm-15.2015.7
ID  - Kim2015/11
ER  -